Welcome to the Brockhouse homepage.  We provide a wide range of complementary diffraction and scattering techniques to fully characterize your materials.

 

High resolution powder diffraction

Pair distribution function (PDF)

High energy diffraction for in-situ studies

Reciprocal space mapping

Small/wide angle X-ray scattering (SAXS/WAXS)

High pressure crystallography

X-ray reflectivity

Grazing incidence diffraction (GID)

Anomalous diffraction and magnetic diffraction


The CLS is currently in an extended outage. The next call for proposals will be from late July to late August. Beam will be back in early 2025.

What we can help you with:

  • Phase indentification and Rietveld refinement using powder diffraction
  • Structure solution of inorganic extended solids using powder diffraction
  • Structure solution of moleuclar compounds that cannot be easily made into single crystals from powder data
  • Local structure of crystals with disorder, amorphous solids, nanoparticles, and liquids
  • High pressure powder diffraction
  • Rapid single crystal diffraction studies
  • Use more than one technique during your visit!