Welcome to the Brockhouse homepage.  We provide a wide range of complementary diffraction and scattering techniques to fully characterize your materials.

 

High resolution powder diffraction

Pair distribution function (PDF)

High energy diffraction for in-situ studies

Reciprocal space mapping

Small/wide angle X-ray scattering (SAXS/WAXS)

High pressure crystallography

X-ray reflectivity

Grazing incidence diffraction (GID)

Anomalous diffraction and magnetic diffraction


 

We have a mail-in option for routine measurements and sample formats

Quicklinks

What we can help you with:

  • Phase indentification and Rietveld refinement using powder diffraction
  • Structure solution of inorganic extended solids using powder diffraction
  • Structure solution of moleuclar compounds that cannot be easily made into single crystals from powder data
  • Local structure of crystals with disorder, amorphous solids, nanoparticles, and liquids
  • High pressure powder diffraction
  • Rapid single crystal diffraction studies
  • Use more than one technique during your visit!

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