Welcome to the Brockhouse homepage. We provide a wide range of complementary diffraction and scattering techniques to fully characterize your materials.
High resolution powder diffraction
Pair distribution function (PDF)
High energy diffraction for in-situ studies
Reciprocal space mapping
Small/wide angle X-ray scattering (SAXS/WAXS)
High pressure crystallography
X-ray reflectivity
Grazing incidence diffraction (GID)
Anomalous diffraction and magnetic diffraction
The CLS is currently in an extended outage. Beam will be back in January.
Quicklinks
- User Login
- Ring Status
- Proposal Calls
- Acknowledgements/Publications
- Student/Postdoc Travel Support
- Training Site
What we can help you with:
- Phase indentification and Rietveld refinement using powder diffraction
- Structure solution of inorganic extended solids using powder diffraction
- Structure solution of moleuclar compounds that cannot be easily made into single crystals from powder data
- Local structure of crystals with disorder, amorphous solids, nanoparticles, and liquids
- High pressure powder diffraction
- Rapid single crystal diffraction studies
- Use more than one technique during your visit!
Latest News »
- News: Apply for the 2024 XRD School!
- Beamline Update: Robot in WLE Beamline
- Beamline Update: New Eiger Detector
- Research Highlight: New method for improved PDF measurements
- Beamline Update: New Detector for HE Beamline